|
Service |
Functionality | Application |
Certificate |
| Measurement of temporal characteristics of pulsed laser radiation | Measurement of temporal characteristics of pulsed laser radiation in the range from 5 ps to 18 ns. | Medicine, nuclear industry, construction, metallurgy. | QSF certificate – R34
Quality management system ISO / IEC 17025 |
| Reference standarts for CMM: plate with spheres, center coordinates | Transferring of a unit of length in the field of geometric parameters measurements of complex shapes surfaces in the range from 20 to 960 µm, U0,95 = 0,9 + 0,75·L µm, L – in m | Engineering | Certificate of Recognition QSF-R38 for the quality management system in accordance with ISO / IEC 17025 |
| Reference standarts for CMM: Reference standarts with spheres, center-to-center distance L | Transferring of a unit of length in the field of geometric parameters measurements of complex shapes surfaces in the range from 10 to 960 mm, U0,95 = 0,9 + 0,75·L µm, L – in m | Engineering | Certificate of Recognition QSF-R38 for the quality management system in accordance with ISO / IEC 17025 |
| Complex Geometry: CMM | Transferring of a unit of length in the field of geometric parameters measurements of complex shapes surfaces in the range from 20 to 2000 мм, U0,95 = 1,35 + 1,5·L µm, L – in m | Engineering | Certificate of Recognition QSF-R38 for the quality management system in accordance with ISO / IEC 17025 |
| Reference standarts for roundness deviation: Reference standarts for calibrating magnification (flattened Reference standarts), Reference standarts for roundness deviation | Transferring of a unit of length in the field of measuring the parameters of shape deviations and location of rotation surfaces in range from 0 to 300 µm, U0,95 = 28 + 10·R nm, R – in µm | Engineering | Certificate of Recognition QSF-R38 for the quality management system in accordance with ISO / IEC 17025 |
| Reference standarts for roundness deviation: sphere, hemisphere: reference standart for roundness deviation | Transferring of a unit of length in the field of measuring the parameters of shape deviations of rotation surfaces in range from 0 to 2000 nm, U0,95 = 28 nm | Engineering | Certificate of Recognition QSF-R38 for the quality management system in accordance with ISO / IEC 17025 |
| Optical surfaces: measures of deviation from flatness | Transfer of the unit of length in the field of measurements of the parameters of deviations from the flatness of optical surfaces in the range from 0,002 to 2 µm, U0,95 = 8,2 nm | Mechanical engineering. | Certificate of Recognition QSF-R38 for the quality management system in accordance with ISO / IEC 17025 |
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